DDR5 RDIMM及支持下一代MR-DIMM单体测试验证系统

The M5513 is an all-inclusive memory test system for next-generation DDR5 multiplexed-rank dual inline

memory modules (MR-DIMM). Operating at blisteringly fast speeds, this test system is an ideal solution for longterm

DIMM development and test. It contains a complete side-band bus controller and provides full access to all

command, address, and data pins on a standard 288-pin DIMM under test. The M5513 can characterize the DDR

interface at its maximum speed, and it can also perform exhaustive memory read-write testing and functional

stress testing. A true ATE-on-Bench, the M5513 reduces cost and enhances interoperability of DDR5 systems.